Detecting samples with extremely small differences in height
1. Suitable for detecting samples with extremely small differences in height , including microstructure, minerals, heads, wafers and hard disk surfaces.
2. Do not have to consider phase difference ring and condenser lens ring block, you can achieve high numerical aperture of the objective lens observation. This means that the DIC can increase the axial resolution, which is particularly significant in tests with high resolution requirements.
3. DIC imaging, the primary factor in determining the contrast is the rate of change in the direction of light propagation. Gradient areas have a high degree of contrast in the field of view and exhibit similar three-dimensional effects.